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Chae, Soo Eun; Kim, Doyoung; Han, Jae-Ho – IEEE Transactions on Education, 2012
Those items or test characteristics that are likely to result in differential item functioning (DIF) across accommodated test forms in statewide tests have received little attention. An examination of elementary-level student performance across accommodated test forms in a large-scale mathematics assessment revealed DIF variations by grades,…
Descriptors: Test Bias, Mathematics Tests, Testing Accommodations, Elementary School Mathematics